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Nanometrology

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Permanent

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Agenda

In our one-hour webinar, you will learn how to measure the invisible with the most precise measurement systems from SIOS. 

Our experts Dr. Denis Dontsov and Enrico Langlotz will inform you about the following main topics:

  • Background of laser interferometry for nanometrology.
  • Nanometrology and nanopositioning machine
  • Principle of differential laser interferometers
  • Applications for long range positioning with nanometer resolution


At the end of the webinar, Enrico Langlotz and Peter Grundschok answer numerous questions about nanometrology.


Speaker: Dr. Denis Dontsov, Managing Director // Enrico Langlotz, R&D / Project Management // Peter Grundschok, Sales Manager

Language: English

Recording from: September 30, 2021

Time: 60 min


Presenter

Mr Dr.-Ing. Denis Dontsov

Geschäftsführer / Managing Director